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Tektronix DSA8200 Digital Serial Analyzer Sampling Oscilloscope

Tektronix DSA8200 Digital Serial Analyzer Sampling Oscilloscope

Product Classification:Oscilloscope

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TEKTRONIX DSA8200

For developing today’s high-speed serial devices, the Tektronix DSA8200 Digital Serial Analyzer sampling oscilloscope is one of the most versatile tools for communication, computer and consumer electronics gigabit transmitter and signal path characterization, and compliance verification. With exceptional bandwidth, signal fidelity, and the most extensible modular architecture, the Tek DSA8200 provides the highest performance TDR and interconnect analysis, most accurate analysis of signal impairments, and BER calculations for current and emerging serial data technology.

The Tektronix DSA8200 Digital Serial Analyzer provides unmatched measurement system fidelity with ultra-low jitter foor that ensures the most accurate acquisition of high-speed signals. You get advanced analysis benefits from the 200 fs acquisition jitter with the Phase Reference module. And in another step forward for a sampling oscilloscope, with the help of the Phase Reference module the DSA8200 can acquire and measure SSC (Spread Spectrum Clocking) signals.

Features and Benefits of the Tektronix DSA8200 include:

State-of-the-Art Sampling Oscilloscope for Communication Signal Analysis, TDR / TDT / Serial Data Network Analysis, Acquisition, and Measurements of Repetitive Ultrafast Signals

  • Acquisition of Spread Spectrum Clocking (SSC) Signals
  • Industry’s first Mainframe to Support up to 8 Input Channels for Increased Flexibility and Throughput
  • Four Color-graded, Variable Persistence Waveform Databases
  • Measurement System with Over 100 Automated Measurements
  • Complete Suite of Communications Measurements includes Both Types of OMA, SSC Profile, and Many Others
  • Automated ITU/ANSI/IEEE Mask Testing
  • Masks and Measurements for SONET/SDH, FC, Ethernet, and Other Standards Built-in
  • Mask Updates can be Loaded from Factory-supplied File
  • Mask Margin Testing for Guard Banding Production Testing

Acquisition Modules

  • Fully Integrated Multirate Optical Modules
  • Optical Modules up to 80 GHz 80C10B
  • High-accuracy "ER Calibrated" Measurement Available in Some Modules
  • Electrical Modules up to 70+ GHz Bandwidth and 5 ps Measured Rise Time (10-90%)
  • Flexible Rate Clock Recovery
  • Clock Recovery with SSC (Spread Spectrum Clocking) Support Available

Jitter, Noise, BER, and Serial Data Link Analysis

  • Measures and Separates Deterministic Data-dependent Jitter from Random Jitter
  • Measures Vertical Noise, Separating Deterministic Data-dependent
  • Noise from Random Noise
  • Highly Accurate BER and Eye Contour Estimation, Support for DDPWS
  • FFE/DFE Equalization, Transmitter Equalization
  • Channel Emulation for Channels with >30 dB of Loss
  • Linear Filter for Fixture De-embedding, Linear Filtering

TDR (Time Domain Reflectometry)

  • Up to 50 GHz TDR Bandwidth with 15 ps Rejected Rise Time and 12 ps Incident Rise Time
  • Lowest Noise for Accurate Repeatable TDR Measurement Results – 600 μVRMSat 50 GHz
  • Independent Sampler Deskew ensures Easy Fixture and Probe De-embedding
  • Industry’s Only Mainframe to Accommodate up to Four True-differential TDR or Electrical Channel Pairs for Increased
  • System Versatility

S-parameters Measurements

  • Up to 50 GHz Differential, Single Ended, Mixed Mode; Insertion, Return Loss, Frequency Domain Crosstalk
  • PCI Express, Serial ATA, Infiniband, Gigabit Ethernet Manufacturing, and Standard Compliance Testing for Gigabit Signal Path and Interconnects – Including Eye Mask Tests
  • Intuitive, Easy, and Accurate for Serial Data, Gigabit Digital Design, and Signal Integrity
  • Fast and Accurate Automated Multiport S-parameter Measurements with Command Line Interface

Industry's Best Standard Time-base Jitter Performance, 800 fsRMS

Industry-leading Time-base Jitter Performance, RMS Available with Phase Reference Mode

Fast Acquisition Rate and High Throughput

True-differential Remote Sampler enabling Placement Near DUT for

Superior Signal Fidelity

FrameScan™ Acquisition Mode with Eye Diagram Averaging:

  • Isolate Data-dependent Faults
  • Examine Low-power Signals

MS Windows XP Operating System

Advanced Connectivity to 3rd party Software

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  • Rich experience

    Rich experience

    Several senior instrument maintenance engineers

  • Advanced technology

    Advanced technology

    The company has advanced technology.

  • Excellent quality

    Excellent quality

    Provide quality assurance for customers

  • Perfect after sale

    Perfect after sale

    To provide customers with perfect after-sales service.

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